TECHNOLOGIES

Technologies of CIT


CIT만의 독보적인 기술들을 소개합니다.

Atomic Sputtering Epitaxy (ASE)


ASE 증착 기술은 RF 스퍼터링 방식을 기반으로 원자를 한 층씩 정밀하게 쌓아가는 기술입니다.

외부 전기적 및 기계적 진동을 차단하고, 내부에서는 단결정 타겟을 사용하여 기판에 원자가 한 층씩

정확하게 쌓이도록 합니다.


이 기술을 통해 PTFE, 사파이어, 유리 등 다양한 기판에서도 고품질의 구리 박막을 생산할 수 있습니다.


Application

반도체, 통신용 회로 등

ASE 증착 기술

ASE 증착 기술은 RF 스퍼터링 방식을 기반으로 원자를 한 층씩 정밀하게 쌓아가는 기술입니다.


외부 전기적 및 기계적 진동을 차단하고, 내부에서는 단결정 타겟을 사용하여 기판에 원자가 한 층씩 정확하게 쌓이도록 합니다.


이 기술을 통해 PTFE, 사파이어, 유리 등 다양한 기판에서도 고품질의 구리 박막을 생산할 수 있습니다.


Application

  • 반도체, 통신용 회로 등

Technical paper

Coherent consolidation of trillions of nucleations for mono-atom step-level flat surfaces

Constructingamono-atomstep-levelultra-flatmaterialsurfaceis challenging, especially for thin films, because it is prohibitively difficult for trillions of clusterstocoherentlymerge.Eventhougha roughmetalsurface, as well as the scattering of carriers at grain boundaries, limits electron transport and obscures their intrinsic properties, the importance of the flat surface has not been emphasised sufficiently. In this study, we describe in detail the initial growth of copper thin films required for mono-atom step-level flat surfaces (MSFSs). 

Deposition using atomic sputtering epitaxy leads to the coherent merging of trillions of islands into a coplanar layer, eventually forming an MSFS, for which the key factor is suggested to be the individual deposition of single atoms. 

Theoretical calculations support that single sputtered atoms ensure the formation of highly aligned nanodroplets and help them to merge 

into a coplanar layer. The realisation of the ultra-flat surfaces is expected to greatly assist efforts to improve quantum behaviour by increasing the coherency of electrons


Coherent consolidation process for a mono-atom step-level flat surface. 

a Cross-sectional bright-field scanning transmission electron microscopy (BF STEM) images. b Corresponding illustrations. The island of twenty-five Cu layers (yellow dotted line in a, formed in the initial growth stage, is maintained and grows laterally.

c Topographic atomic force microscopy images acquired from samples of five different thicknesses, corresponding to initial deposition times of 15, 30, 45, 60 and 120 s. d Cross-sectional high-resolution scanning transmission electron microscopy (HRTEM) image of the 12-nm-thick single-crystal Cu film showing mono-atom step-level flat surfaces (MSFS) with a root-mean-square (RMS) roughness

of ~0.2 nm. e Schematic side view of MSFS in d.